Simplified likelihood based goodness-of-fit tests for the Weibull distribution

Meryam Krit, Olivier Gaudoin, Min Xie, Emmanuel Remy

    Research output: Contribution to journalA1: Web of Science-article

    Abstract


    Original languageEnglish
    JournalCommunications in Statistics - Simulation and Computation
    Volume45
    Issue number3
    Pages (from-to)920-951
    Number of pages32
    ISSN0361-0918
    DOIs
    Publication statusPublished - 2016

    Keywords

    • Extreme value distribution
    • Goodness-of-fit tests
    • Likelihood ratio test
    • Reliability
    • Score test
    • Wald test
    • Weibull distribution
    • Primary 62N05
    • Secondary 62F03
    • I EXTREME-VALUE
    • PARAMETER
    • EXPONENTIALITY
    • FAMILY
    • GAMMA
    • MODEL

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